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Contamination Monitoring Solutions for the Photonics & Optics Industry

Particle Counters and Molecular Contamination Monitoring Solutions

Advanced optics manufacturing requires much cleaner processing environments than were necessary in the past. Smaller device structures, use of shorter wavelengths, and higher laser power densities are all factors that make advanced components more susceptible to damage from contamination.

Particle Measuring Systems provides you with the tools to determine how clean your photonics & optics manufacturing environment is, and can help you keep it that way.

Talk to one of our applications experts to see how Particle Measuring Systems’ 50+ years of experience in contamination control can help you achieve a clean environment that maximizes productivity.

Contamination Control Products

データインテグリティ対応気中パーティクルカウンタ: Lasair® Pro

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AMCモニタ: AirSentry® II Point-of-Use

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シリンジ サンプリング システム: SLS

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光デバイス

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PoE対応リモート気中パーティクルカウンタ:
Airnet® II 4チャンネル

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