Contamination Control for
Semiconductor and Microelectronics Industry
Industry Leading
Contamination Monitoring Solutions
Particle Measuring Systems has the application expertise and industry-leading sensitivity particle monitoring instruments you need to control contamination to reduce yield loss.
We provide the global expertise and high-performance laser particle counters you count on. We continuously count particles when and where products are at risk to determine how clean your semiconductor/microelectronics processes really are.
Particle Measuring Systems is the only company to reliably provide you with the highest particle counting sensitivity for chemicals, water, airborne, compressed gas, and molecular applications.
Point of Use Contamination Monitoring
to Protect Your Product
You need your product protected where it is and when the contamination occurs. Our solutions include:
- Continuous real-time contamination monitoring for actionable data
- Sensitivity-leading metrology solutions
- Measure contamination when and where products are at risk
- Improve throughput and quality
